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Laser 2000 provides a wide range of different beam profiling solutions covering a broad range of applications such as beam diameter, divergence, XY & Z intensity mapping, and M-squared measurements to name but a few, all within a feature rich windows TM software environment. With USB interfaces, our beam profiling solutions are easy to set up and fast and simple to use. Two main systems are provided: scanning/rotating slit systems for ISO based XYZ measurements; and CCD camera based systems for high speed dynamic beam analysis and adjustment. |
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